Lehrinhalte
Introduction to microwave measurement technoloies, high frequency components and their poperties: rf power measurement, spectrum analysis, vertor network analysis (s-parameter, x-parameter, calibration techniques), on-wafer measurements, load/source-pull, material characterization
Voraussetzungen
Recommended: Grundlagen der Nachrichtentechnik, Hochfrequenztechnik I
Introduction to microwave measurement technoloies, high frequency components and their poperties: rf power measurement, spectrum analysis, vertor network analysis (s-parameter, x-parameter, calibration techniques), on-wafer measurements, load/source-pull, material characterization
Voraussetzungen
Recommended: Grundlagen der Nachrichtentechnik, Hochfrequenztechnik I
- Lehrende: Holger Maune
Semester: ST 2018