Lehrinhalte
In-situ electron microscopy techniques are becoming increasingly established to understand fundamental processes during synthesis, processing and application of functional materials at the atomic and nanometer scale. Different stimuli ranging from heating or electrical biasing to mechanical deformation and various liquid and gas environments are used to model selected processes and follow the structural changes with the full range of advanced imaging techniques in the TEM to correlate structure and properties of materials and identify transient states in reactions.
This lecture will (a) review the most important imaging techniques in the TEM (BF-/DF-/HRTEM, STEM), analytical techniques (EELS, EDX) and recent developments such as ACOM orientation mapping and other 4D-STEM techniques, (b) discuss electron beam effects in materials, (c) introduce various in-situ thermal, electrical, mechanical, liquid and gas phase setups, and (d) their application to understand processes in (nanostructured) materials. The aim is to provide the student with tools for advanced atomic and nanoscale characterization of materials and processes.
Literatur
1. Transmission Electron Microscopy, D.B. Williams and C.B. Carter, (2nd Ed.) Springer Verlag
2. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM, R. Egerton, Springer Verlag
3. Stephen J. Pennycook, Peter D. Nellist (Eds.): Scanning Transmission Electron Microscopy - Imaging and Analysis
4. G. Dehm, J.M. Howe, J. Zweck (Eds.): In-situ Electron Microscopy, Wiley-VCH
5. T.W. Hansen, J.B. Wagner (Eds.): Controlled Atmosphere Transmission Electron Microscopy, Springer
6. A. Ziegler, H. Graafsma, X.F. Zhang, J.W.M. Frenken (Eds.): In-situ Materials Characterization Across Spatial and Temporal Scales, Springer
Voraussetzungen
recommended: module "Transmission Electron Microscopy (TEM)"
recommended: module "Scanning Transmission Electron Microscopy for Materials Science"
Offizielle Kursbeschreibung
The students will be introduced to the possibilities modern electron microscopy imaging and spectroscopy techniques offer for advanced atomic/nanoscale structural and chemical characterization and the different in-situ approaches that can be implemented to follow complex processes in materials. The aim is to develop an idea how materials research can benefit from (in-situ) electron microscopy and to provide the students with a basis to interpret (in-situ) electron microscopy data and to recognize challenges and pitfalls, enabling independent critical analysis of his/her own experimental research and published structural characterization.
Online-Angebote
Moodle
In-situ electron microscopy techniques are becoming increasingly established to understand fundamental processes during synthesis, processing and application of functional materials at the atomic and nanometer scale. Different stimuli ranging from heating or electrical biasing to mechanical deformation and various liquid and gas environments are used to model selected processes and follow the structural changes with the full range of advanced imaging techniques in the TEM to correlate structure and properties of materials and identify transient states in reactions.
This lecture will (a) review the most important imaging techniques in the TEM (BF-/DF-/HRTEM, STEM), analytical techniques (EELS, EDX) and recent developments such as ACOM orientation mapping and other 4D-STEM techniques, (b) discuss electron beam effects in materials, (c) introduce various in-situ thermal, electrical, mechanical, liquid and gas phase setups, and (d) their application to understand processes in (nanostructured) materials. The aim is to provide the student with tools for advanced atomic and nanoscale characterization of materials and processes.
Literatur
1. Transmission Electron Microscopy, D.B. Williams and C.B. Carter, (2nd Ed.) Springer Verlag
2. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM, R. Egerton, Springer Verlag
3. Stephen J. Pennycook, Peter D. Nellist (Eds.): Scanning Transmission Electron Microscopy - Imaging and Analysis
4. G. Dehm, J.M. Howe, J. Zweck (Eds.): In-situ Electron Microscopy, Wiley-VCH
5. T.W. Hansen, J.B. Wagner (Eds.): Controlled Atmosphere Transmission Electron Microscopy, Springer
6. A. Ziegler, H. Graafsma, X.F. Zhang, J.W.M. Frenken (Eds.): In-situ Materials Characterization Across Spatial and Temporal Scales, Springer
Voraussetzungen
recommended: module "Transmission Electron Microscopy (TEM)"
recommended: module "Scanning Transmission Electron Microscopy for Materials Science"
Offizielle Kursbeschreibung
The students will be introduced to the possibilities modern electron microscopy imaging and spectroscopy techniques offer for advanced atomic/nanoscale structural and chemical characterization and the different in-situ approaches that can be implemented to follow complex processes in materials. The aim is to develop an idea how materials research can benefit from (in-situ) electron microscopy and to provide the students with a basis to interpret (in-situ) electron microscopy data and to recognize challenges and pitfalls, enabling independent critical analysis of his/her own experimental research and published structural characterization.
Online-Angebote
Moodle
- Lehrende: Christian Kübel
Semester: SoSe 2021