Digital Teaching
Im Rahmen des Kurses 11-01-7982-ku Introduction to Scanning Electron Microscopy" werden die 2 folgenden Lehrveranstaltungen online via ZOOM im WS2021-22 stattfinden.
1. Montag, den 15. November 2021, 9:00-11:00, Zoom Meeting ID: 837 0458 9921, Passcode: 481644
2. Dienstag, den 16. November 2021, 9:00-11:00, Zoom Meeting ID: 821 6977 5529, Passcode: 508409
Weitere Informationen per E-mail: philipp.komissinskiy@tu-darmstadt.de
Die weitere Information über die praktischen Übungen am HREM wird in Moodle im Oktober angekündigt werden.
Lehrinhalte
Basics of scanning electron microscopy;
Breakdown of scanning electron microscopes (SEM)
Electron and x-ray detectors
Analysis of topography with secondary electrons
Back scattered electrons for materials contrast
Characteristic x-rays for microanalysis
Sample preparation for SEM studies
Introduction to the SEM Philips XL30-FEG: access to the SEM is granted for the course participants
Literature
1. J. Goldstein, Scannin Electron Microscopy and Microanalysis, 3rd edition, Springer Science Business Media, New York 2003
2. L. Reimer, Scanning Electron Microscopy: Physics of Image Formation and Microanalysis, 2nd edition, Springer-Verlag 1998.
Voraussetzungen
M.Sc. and Ph.D. students of the departments of Materials Science, Physics and Chemistry
Zusätzliche Informationen
Course plan:
2 lectures: 6 academic hours
Practical exercise at the SEM Philips XL30-FEG: 6 academic hours
Report on the practical exercise part is compulsory for before examination
Examination: oral
Registration for the course for all Students (starting from the 7th Semester) is via TUCaN
Registration via e-mail is possible for those interested in the access to the SEM
Im Rahmen des Kurses 11-01-7982-ku Introduction to Scanning Electron Microscopy" werden die 2 folgenden Lehrveranstaltungen online via ZOOM im WS2021-22 stattfinden.
1. Montag, den 15. November 2021, 9:00-11:00, Zoom Meeting ID: 837 0458 9921, Passcode: 481644
2. Dienstag, den 16. November 2021, 9:00-11:00, Zoom Meeting ID: 821 6977 5529, Passcode: 508409
Weitere Informationen per E-mail: philipp.komissinskiy@tu-darmstadt.de
Die weitere Information über die praktischen Übungen am HREM wird in Moodle im Oktober angekündigt werden.
Lehrinhalte
Basics of scanning electron microscopy;
Breakdown of scanning electron microscopes (SEM)
Electron and x-ray detectors
Analysis of topography with secondary electrons
Back scattered electrons for materials contrast
Characteristic x-rays for microanalysis
Sample preparation for SEM studies
Introduction to the SEM Philips XL30-FEG: access to the SEM is granted for the course participants
Literature
1. J. Goldstein, Scannin Electron Microscopy and Microanalysis, 3rd edition, Springer Science Business Media, New York 2003
2. L. Reimer, Scanning Electron Microscopy: Physics of Image Formation and Microanalysis, 2nd edition, Springer-Verlag 1998.
Voraussetzungen
M.Sc. and Ph.D. students of the departments of Materials Science, Physics and Chemistry
Zusätzliche Informationen
Course plan:
2 lectures: 6 academic hours
Practical exercise at the SEM Philips XL30-FEG: 6 academic hours
Report on the practical exercise part is compulsory for before examination
Examination: oral
Registration for the course for all Students (starting from the 7th Semester) is via TUCaN
Registration via e-mail is possible for those interested in the access to the SEM
- Lehrende: Philipp Komissinskiy
Semester: WT 2021/22