Lehrinhalte
The lecture deals with characterization methods of materials science. In the first part, spectroscopic methods for elemental analysis are treated e.g. UV-Vis photometry, atomic absorption spectrometry, X- ray fluorescence analysis, neutron activation analysis, secondary ion mass spectrometry, particle induced X-ray emission, Rutherford backscattering spectroscopy, and elastic recoil detection analysis.
The second part of the lecture covers scattering and spectroscopic methods like Small Angle Xray Scattering, Xray Absorption Spectroscopy, Nuclear Magnetic Resonance, Moessbauer Spectroscopy and others.
Voraussetzungen
Bachelor of Science in Materials Science or comparable.
Erwartete Teilnehmerzahl
50
Official Course Description
The lecture deals with characterization methods of materials science. In the first part, spectroscopic methods for elemental analysis are treated e.g. UV-Vis photometry, atomic absorption spectrometry, X- ray fluorescence analysis, neutron activation analysis, secondary ion mass spectrometry, particle induced X-ray emission, Rutherford backscattering spectroscopy, and elastic recoil detection analysis.
The second part of the lecture covers scattering and spectroscopic methods like Small Angle Xray Scattering, Xray Absorption Spectroscopy, Nuclear Magnetic Resonance, Moessbauer Spectroscopy and others.
The lecture deals with characterization methods of materials science. In the first part, spectroscopic methods for elemental analysis are treated e.g. UV-Vis photometry, atomic absorption spectrometry, X- ray fluorescence analysis, neutron activation analysis, secondary ion mass spectrometry, particle induced X-ray emission, Rutherford backscattering spectroscopy, and elastic recoil detection analysis.
The second part of the lecture covers scattering and spectroscopic methods like Small Angle Xray Scattering, Xray Absorption Spectroscopy, Nuclear Magnetic Resonance, Moessbauer Spectroscopy and others.
Voraussetzungen
Bachelor of Science in Materials Science or comparable.
Erwartete Teilnehmerzahl
50
Official Course Description
The lecture deals with characterization methods of materials science. In the first part, spectroscopic methods for elemental analysis are treated e.g. UV-Vis photometry, atomic absorption spectrometry, X- ray fluorescence analysis, neutron activation analysis, secondary ion mass spectrometry, particle induced X-ray emission, Rutherford backscattering spectroscopy, and elastic recoil detection analysis.
The second part of the lecture covers scattering and spectroscopic methods like Small Angle Xray Scattering, Xray Absorption Spectroscopy, Nuclear Magnetic Resonance, Moessbauer Spectroscopy and others.
- Lehrende: DonnerWolfgang
- Lehrende: EnsingerWolfgang
Semester: ST 2022