Course Contents
The lecture deals with characterization methods of materials science. In the first part, spectroscopic methods for elemental analysis are treated e.g. UV-Vis photometry, atomic absorption spectrometry, X- ray fluorescence analysis, neutron activation analysis, secondary ion mass spectrometry, particle induced X-ray emission, Rutherford backscattering spectroscopy, and elastic recoil detection analysis.
The second part of the lecture covers scattering and spectroscopic methods like Small Angle Xray Scattering, Xray Absorption Spectroscopy, Nuclear Magnetic Resonance, Moessbauer Spectroscopy and others.
Preconditions
Bachelor of Science in Materials Science or comparable.
Expected Number of Participants
50
Official Course Description
The lecture deals with characterization methods of materials science. In the first part, spectroscopic methods for elemental analysis are treated e.g. UV-Vis photometry, atomic absorption spectrometry, X- ray fluorescence analysis, neutron activation analysis, secondary ion mass spectrometry, particle induced X-ray emission, Rutherford backscattering spectroscopy, and elastic recoil detection analysis.
The second part of the lecture covers scattering and spectroscopic methods like Small Angle Xray Scattering, Xray Absorption Spectroscopy, Nuclear Magnetic Resonance, Moessbauer Spectroscopy and others.
The lecture deals with characterization methods of materials science. In the first part, spectroscopic methods for elemental analysis are treated e.g. UV-Vis photometry, atomic absorption spectrometry, X- ray fluorescence analysis, neutron activation analysis, secondary ion mass spectrometry, particle induced X-ray emission, Rutherford backscattering spectroscopy, and elastic recoil detection analysis.
The second part of the lecture covers scattering and spectroscopic methods like Small Angle Xray Scattering, Xray Absorption Spectroscopy, Nuclear Magnetic Resonance, Moessbauer Spectroscopy and others.
Preconditions
Bachelor of Science in Materials Science or comparable.
Expected Number of Participants
50
Official Course Description
The lecture deals with characterization methods of materials science. In the first part, spectroscopic methods for elemental analysis are treated e.g. UV-Vis photometry, atomic absorption spectrometry, X- ray fluorescence analysis, neutron activation analysis, secondary ion mass spectrometry, particle induced X-ray emission, Rutherford backscattering spectroscopy, and elastic recoil detection analysis.
The second part of the lecture covers scattering and spectroscopic methods like Small Angle Xray Scattering, Xray Absorption Spectroscopy, Nuclear Magnetic Resonance, Moessbauer Spectroscopy and others.
- Lehrende: Wolfgang Donner
- Lehrende: Wolfgang Ensinger
Semester: ST 2023