Kursinformation

Course Contents
The first part of the lecture covers scattering and spectroscopic methods for structural characterization like Small Angle Xray Scattering, Xray Absorption Spectroscopy, Nuclear Magnetic Resonance and others.
In the second part, spectroscopic methods for elemental analysis are treated e.g. UV-Vis photometry, atomic absorption spectrometry, X- ray fluorescence analysis, neutron activation analysis, secondary ion mass spectrometry, particle induced X-ray emission, Rutherford backscattering spectroscopy, and elastic recoil detection analysis.

Literature
Underneath the Bragg peaks: Structural analysis of complex materials
T. Egami and S.J.L. Billinge
Pergamon 2003

Structure from diffraction methods
Edt. by D.W. Bruce et al.
Wiley 2014

Small angle x-ray scattering
O. Glatter and O. Kratky
Academic Press 1982

Local structural characterization
Edt. by D.W. Bruce et al.
Wiley 2014

Preconditions
Bachelor of Science in Materials Science or comparable.

Expected Number of Participants
120

Official Course Description
The lecture deals with characterization methods of materials science.
Both structural and chemical analysis are covered.