Digitale Lehre
Course contents will be communicated via MOODLE.
Lehrinhalte
Aim of this lecture is, on the one hand, to show the correlation of surface
properties with their application in modern devices and, on the other hand,
to give a detailed understanding of surface sensitive methods to analyse
structure, chemical composition and electronic structure of surfaces, that
allows a strategical use of those methods for practical characterisation
of materials surfaces.
[u]Contents[/u]
[u]0 Introduction: Properties and applications of solid surfaces[/u]
[u]1 Repetitorium of the basics of solid state physics[/u]
1.1 Crystal structures and the reciprocal lattice
1.2 Phonons
1.3 From bonds to bands: electronic structure of solids
1.4 Properties of solids
[u]2 Fundamentals of physics and chemistry at surfaces[/u]
2.1 Structure of ideal and real surfaces
2.1.1 Surface orientations and surface mashes
2.1.2 Relaxation and reconstruction
2.1.3 Steps, kinks and defects: diffusion and Mass transport
2.1.4 Thermodynamics at surfaces: surface tension, stress and strain and
surface roughening
2.1.5 Properties of polycrystalline and amorphous surfaces
2.2 Surface phonons
2.3 Electronic structure of surfaces
2.3.1 Surface band structure
2.3.2 Surface states
2.3.3 Work function
2.3.4 Energetic situation at surfaces: surface core level shift and
surface band bending
2.4 Preparation of clean and ordered solid state surfaces
2.5 Adsorption
2.6 Epitaxy and layer growth
2.7 Chemical reactions at surfaces
2.8 Catalysis
[u]3 Spectroscopic methods to study the chemical composition and the electronic structure[/u]
3.1 Electron spectroscopy
3.1.1 On the interaction of electrons and solid state surfaces
3.1.2 Auger-electron spectroscopy (AES)
3.1.3 Photoelectron spectroscopy (PES)
3.1.3.1 X-ray photoelectron spectroscopy (XPS)
3.1.3.2 Ultraviolett photoelectron spectroscopy (UPS)
3.1.3.3 Photoelectron spectroscopy excited by synchrotron radiation
3.1.4 Inverse photoemission spectroscopy (IPE, BIS)
3.1.5 Elektron energy loss spectroscopy (ELS)
3.2 x-ray absorption spectroscopy (XAS, NEXAFS)
3.3 x-ray emission spectroscopy (XES)
3.4 Desorption spectroscopies
3.4.1 Thermal desorption spectroscopy (TDS)
3.4.2 Electron stimulated desorption (ESD)
3.4.3 Photon stimulated desorption (PSD)
{3.5 Secondary ion mass spectrometry (SIMS)}
{3.6 Optical spectroscopy}
[u]4 Methods for studies of the phonon structure[/u]
4.1 High resolution electron energy loss spectroscopy (HREELS)
4.2 Infrared spectroscopy
4.3 Raman-spectroscopy
{4.4 Neutron diffraction}
[u]5 Diffraction- and Scattering methods for surface structure studies[/u]
5.1 Electron diffraction
5.1.1 High energy electron diffraction (LEED)
5.1.2 Reflection high energy electron diffraction (RHEED)
5.1.3 Medium energy electron diffraction (MEED)
5.1.4 Photo- and Auger electron diffraction (PD, XPD, AED)
5.2 x-ray absorption fine structure spectroscopy (EXAFS)
{5.3 Ion scattering (ISS, LEISS)}
{5.4 Rutherford Backscattering (RBS)}
{5.5 X-ray diffraction (XRD)}
[u]6 Microscopic methods for surface studies[/u]
6.1 Field ion microscopy (FIM)
6.2 Field emission microscopy (FEM)
6.3 Scanning probe microscopy
6.3.1 Scanning tunneling microscopy (STM)
6.3.2 Atomic force microscopy (AFM)
{6.3.3 Scanning Optical Nearfield microscopy (SNOM)}
{6.4 Electronmicroscopy ((HR)SEM, TEM)}
6.5 Microspectroscopy und spectromicroscopy: on the photoemission-
electronmicroscope (PEEM)
{6.6 x-ray microscopy}
{Topics will only be shortly introduced in context with related methods,
because they are not surface sensitive and will be discussed in detail
in other lectures}
Literatur
-N.W. Ashcroft, N.D. Mermin: Solid State Physics (ITPS Thomson Learning, 2000)
-C.Kittel: Einführung in die Festkörperphysik (Oldenbourg, 1989)
-H.Ibach, H.Lüth: Einführung in die Festkörperphysik (Springer, 1989)
-K.H.Hellwege: Festkörperphysik (Springer, 1981)
-C.Hamann, C.Weißmantel: Grundlagen der Festkörperphysik (Springer, 1995)
-L.Bergmann, C.Schaefer: Band 6 ? Festkörperphysik (deGruyter, 1992)
-A.Zangwill: Physics at surfaces (Cambridge University Press, 1988)
-A.P.Sutton: Elektronische Struktur in Materialien (VCH, 1996)
-M.Henzler, W.Göpel: Oberflächenphysik des Festkörpers (Teubner, 1991)
-L.C.Feldman, J.W.Mayer, Fundamentals of surfaces and thin film analysis
(North Holland, 1986)
-H.Lüth: Surfaces and Interfaces of Solid Materials (Springer, 1995)
-S.G.Davison, M.Steslicka: Basic Theory of Surface States (Oxford Science
Publications, 1992)
-P.Y.Yu, M.Cardona: Fundamentals of Semiconductors (Springer, 1996)
-W.Mönch: Semiconductor Surfaces and Interfaces (Springer, 2001)
-G.Ertl, J.Küppers: Low Energy Electrons and Surface Chemistry (VCH, 1974)
-J.B.Pendry: Low Energy Electron Diffraction (Academic Press, 1974)
-M.A.van Hove, S.Y.Tong: Surface Crystallography by LEED (Springer, 1979)
-D.P.Woodruff, T.A.Delchar: Modern Techniques in Surface Science (Cambridge
University Press, 1986)
-D.Briggs, M.P.Seah: Practical Surface Analysis (Wiley, 1996)
-F.Reinhard, St.Hüfner: Photoelektronenspektroskopie (Physik Journal September 2002)
-St.Hüfner: Photoelectron Spectroscopy (Springer, 1994)
-M.Cardona, L.Ley: Photoemission in Solids I II (Springer)
-M.Grasserbauer, H.J.Dudek, M.F.Ebel: Angewandte Oberflächenanalyse (Springer, 1986)
-M.Grasserbauer, H.W.Werner: Analysis of Microelectronic Materials and
Devices (Wiley, 1991)
-R.Courths, S.Hüfner, Phys. Rep. 112, 53 (1984)
-C.R.Brundle, A.D.Baker: Electron spectroscopy: Theory, techniques and
applications (Academic press, 1977)
-C.D.Wagner, W.M.Riggs, L.E.Davis, J.F.Moulder, G.E.Muilenberg: Handbook
of X-ray Photoelectron Spectroscopy (Perkin-Elmer 1979)
-V.Dose: Inverse Photoemission Spectroscopy
-H.Kuzmany: Festkörperspektroskopie ? Eine Einführung (Springer, 1990)
-O.Schaff, A.M.Bradshaw: Photoelektronenbeugung, Phys. Bl. 52 (1996) 997
-C.S.Fadley: The Study of Surface Structures by Photoelectron Diffraction
and Auger Electron Diffraction (Synchrotron Radiation Research: Advances
in Surface and Interface Science, Vol 1: Techniques, Plenum Press, 1992)
-W.F.Egelhoff: X-Ray Photoelectron and Auger Electron Forward Scattering:
A Structural Diagnostic for Epitaxial Thin Films (Ultrathin Magnetic Structures
I - An Introduction to Electronic, Magnetic and Structural Properties,
Springer, 1994)
-H.-J.Güntherodt, R.Wiesendanger: Scanning Tunneling Microscopy I-III (Springer, 1994)
-J.T.Yates: Experimental Innovations in Surface Science (Springer, 1997)
Voraussetzungen
Students of Materials Science, Physics or Chemistry in the 3rd or 4th year
Online-Angebote
moodle
Course contents will be communicated via MOODLE.
Lehrinhalte
Aim of this lecture is, on the one hand, to show the correlation of surface
properties with their application in modern devices and, on the other hand,
to give a detailed understanding of surface sensitive methods to analyse
structure, chemical composition and electronic structure of surfaces, that
allows a strategical use of those methods for practical characterisation
of materials surfaces.
[u]Contents[/u]
[u]0 Introduction: Properties and applications of solid surfaces[/u]
[u]1 Repetitorium of the basics of solid state physics[/u]
1.1 Crystal structures and the reciprocal lattice
1.2 Phonons
1.3 From bonds to bands: electronic structure of solids
1.4 Properties of solids
[u]2 Fundamentals of physics and chemistry at surfaces[/u]
2.1 Structure of ideal and real surfaces
2.1.1 Surface orientations and surface mashes
2.1.2 Relaxation and reconstruction
2.1.3 Steps, kinks and defects: diffusion and Mass transport
2.1.4 Thermodynamics at surfaces: surface tension, stress and strain and
surface roughening
2.1.5 Properties of polycrystalline and amorphous surfaces
2.2 Surface phonons
2.3 Electronic structure of surfaces
2.3.1 Surface band structure
2.3.2 Surface states
2.3.3 Work function
2.3.4 Energetic situation at surfaces: surface core level shift and
surface band bending
2.4 Preparation of clean and ordered solid state surfaces
2.5 Adsorption
2.6 Epitaxy and layer growth
2.7 Chemical reactions at surfaces
2.8 Catalysis
[u]3 Spectroscopic methods to study the chemical composition and the electronic structure[/u]
3.1 Electron spectroscopy
3.1.1 On the interaction of electrons and solid state surfaces
3.1.2 Auger-electron spectroscopy (AES)
3.1.3 Photoelectron spectroscopy (PES)
3.1.3.1 X-ray photoelectron spectroscopy (XPS)
3.1.3.2 Ultraviolett photoelectron spectroscopy (UPS)
3.1.3.3 Photoelectron spectroscopy excited by synchrotron radiation
3.1.4 Inverse photoemission spectroscopy (IPE, BIS)
3.1.5 Elektron energy loss spectroscopy (ELS)
3.2 x-ray absorption spectroscopy (XAS, NEXAFS)
3.3 x-ray emission spectroscopy (XES)
3.4 Desorption spectroscopies
3.4.1 Thermal desorption spectroscopy (TDS)
3.4.2 Electron stimulated desorption (ESD)
3.4.3 Photon stimulated desorption (PSD)
{3.5 Secondary ion mass spectrometry (SIMS)}
{3.6 Optical spectroscopy}
[u]4 Methods for studies of the phonon structure[/u]
4.1 High resolution electron energy loss spectroscopy (HREELS)
4.2 Infrared spectroscopy
4.3 Raman-spectroscopy
{4.4 Neutron diffraction}
[u]5 Diffraction- and Scattering methods for surface structure studies[/u]
5.1 Electron diffraction
5.1.1 High energy electron diffraction (LEED)
5.1.2 Reflection high energy electron diffraction (RHEED)
5.1.3 Medium energy electron diffraction (MEED)
5.1.4 Photo- and Auger electron diffraction (PD, XPD, AED)
5.2 x-ray absorption fine structure spectroscopy (EXAFS)
{5.3 Ion scattering (ISS, LEISS)}
{5.4 Rutherford Backscattering (RBS)}
{5.5 X-ray diffraction (XRD)}
[u]6 Microscopic methods for surface studies[/u]
6.1 Field ion microscopy (FIM)
6.2 Field emission microscopy (FEM)
6.3 Scanning probe microscopy
6.3.1 Scanning tunneling microscopy (STM)
6.3.2 Atomic force microscopy (AFM)
{6.3.3 Scanning Optical Nearfield microscopy (SNOM)}
{6.4 Electronmicroscopy ((HR)SEM, TEM)}
6.5 Microspectroscopy und spectromicroscopy: on the photoemission-
electronmicroscope (PEEM)
{6.6 x-ray microscopy}
{Topics will only be shortly introduced in context with related methods,
because they are not surface sensitive and will be discussed in detail
in other lectures}
Literatur
-N.W. Ashcroft, N.D. Mermin: Solid State Physics (ITPS Thomson Learning, 2000)
-C.Kittel: Einführung in die Festkörperphysik (Oldenbourg, 1989)
-H.Ibach, H.Lüth: Einführung in die Festkörperphysik (Springer, 1989)
-K.H.Hellwege: Festkörperphysik (Springer, 1981)
-C.Hamann, C.Weißmantel: Grundlagen der Festkörperphysik (Springer, 1995)
-L.Bergmann, C.Schaefer: Band 6 ? Festkörperphysik (deGruyter, 1992)
-A.Zangwill: Physics at surfaces (Cambridge University Press, 1988)
-A.P.Sutton: Elektronische Struktur in Materialien (VCH, 1996)
-M.Henzler, W.Göpel: Oberflächenphysik des Festkörpers (Teubner, 1991)
-L.C.Feldman, J.W.Mayer, Fundamentals of surfaces and thin film analysis
(North Holland, 1986)
-H.Lüth: Surfaces and Interfaces of Solid Materials (Springer, 1995)
-S.G.Davison, M.Steslicka: Basic Theory of Surface States (Oxford Science
Publications, 1992)
-P.Y.Yu, M.Cardona: Fundamentals of Semiconductors (Springer, 1996)
-W.Mönch: Semiconductor Surfaces and Interfaces (Springer, 2001)
-G.Ertl, J.Küppers: Low Energy Electrons and Surface Chemistry (VCH, 1974)
-J.B.Pendry: Low Energy Electron Diffraction (Academic Press, 1974)
-M.A.van Hove, S.Y.Tong: Surface Crystallography by LEED (Springer, 1979)
-D.P.Woodruff, T.A.Delchar: Modern Techniques in Surface Science (Cambridge
University Press, 1986)
-D.Briggs, M.P.Seah: Practical Surface Analysis (Wiley, 1996)
-F.Reinhard, St.Hüfner: Photoelektronenspektroskopie (Physik Journal September 2002)
-St.Hüfner: Photoelectron Spectroscopy (Springer, 1994)
-M.Cardona, L.Ley: Photoemission in Solids I II (Springer)
-M.Grasserbauer, H.J.Dudek, M.F.Ebel: Angewandte Oberflächenanalyse (Springer, 1986)
-M.Grasserbauer, H.W.Werner: Analysis of Microelectronic Materials and
Devices (Wiley, 1991)
-R.Courths, S.Hüfner, Phys. Rep. 112, 53 (1984)
-C.R.Brundle, A.D.Baker: Electron spectroscopy: Theory, techniques and
applications (Academic press, 1977)
-C.D.Wagner, W.M.Riggs, L.E.Davis, J.F.Moulder, G.E.Muilenberg: Handbook
of X-ray Photoelectron Spectroscopy (Perkin-Elmer 1979)
-V.Dose: Inverse Photoemission Spectroscopy
-H.Kuzmany: Festkörperspektroskopie ? Eine Einführung (Springer, 1990)
-O.Schaff, A.M.Bradshaw: Photoelektronenbeugung, Phys. Bl. 52 (1996) 997
-C.S.Fadley: The Study of Surface Structures by Photoelectron Diffraction
and Auger Electron Diffraction (Synchrotron Radiation Research: Advances
in Surface and Interface Science, Vol 1: Techniques, Plenum Press, 1992)
-W.F.Egelhoff: X-Ray Photoelectron and Auger Electron Forward Scattering:
A Structural Diagnostic for Epitaxial Thin Films (Ultrathin Magnetic Structures
I - An Introduction to Electronic, Magnetic and Structural Properties,
Springer, 1994)
-H.-J.Güntherodt, R.Wiesendanger: Scanning Tunneling Microscopy I-III (Springer, 1994)
-J.T.Yates: Experimental Innovations in Surface Science (Springer, 1997)
Voraussetzungen
Students of Materials Science, Physics or Chemistry in the 3rd or 4th year
Online-Angebote
moodle
- Lehrende: Anonym
- Lehrende: Jan Philipp Hofmann
- Lehrende: Wolfram Jaegermann
- Lehrende: Bernhard Kaiser
- Lehrende: Andreas Klein
Semester: WT 2020/21